航空精密鑄件射線檢測仿真及驗證試驗
發布(bu)日(ri)期：2020/3/31 17:36:22 訪問(wen)次數：3737
航(hang)空(kong)精(jing)密鑄(zhu)件(jian)(jian)(jian)(jian)存在(zai)體積大，空(kong)腔多，形(xing)狀復雜(za)等特點，使用(yong)傳統(tong)方法(fa)對這(zhe)些鑄(zhu)件(jian)(jian)(jian)(jian)進行射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)檢(jian)測(ce)(ce)(ce)(ce)工(gong)(gong)藝編(bian)制(zhi)時，為避免(mian)漏檢(jian)情況的(de)(de)出(chu)(chu)現(xian)，往往需(xu)要(yao)先對鑄(zhu)件(jian)(jian)(jian)(jian)進行大量試拍，計算機(ji)射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)技(ji)術無(wu)直接(jie)材料成本消耗并可(ke)方便、快速的(de)(de)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)出(chu)(chu)實(shi)(shi)際透照過程，為真(zhen)(zhen)實(shi)(shi)透照提供參考(kao)數(shu)據(ju)，成為傳統(tong)射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)檢(jian)測(ce)(ce)(ce)(ce)工(gong)(gong)藝編(bian)制(zhi)的(de)(de)最好輔助工(gong)(gong)具(ju)。本文以復雜(za)的(de)(de)航(hang)空(kong)精(jing)密鑄(zhu)件(jian)(jian)(jian)(jian)為對象(xiang)，在(zai)測(ce)(ce)(ce)(ce)試和(he)修正(zheng)(zheng)XRSIM射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)軟(ruan)件(jian)(jian)(jian)(jian)的(de)(de)黑度(du)(du)修正(zheng)(zheng)系(xi)(xi)(xi)數(shu)、測(ce)(ce)(ce)(ce)試XRSIM軟(ruan)件(jian)(jian)(jian)(jian)中的(de)(de)密度(du)(du)分辨力、空(kong)間分辨力等檢(jian)測(ce)(ce)(ce)(ce)靈(ling)(ling)敏(min)度(du)(du)分析功能的(de)(de)基(ji)礎上，實(shi)(shi)現(xian)一種試驗測(ce)(ce)(ce)(ce)量與軟(ruan)件(jian)(jian)(jian)(jian)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)相結合(he)的(de)(de)方式來(lai)修正(zheng)(zheng)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)軟(ruan)件(jian)(jian)(jian)(jian)的(de)(de)黑度(du)(du)，保證軟(ruan)件(jian)(jian)(jian)(jian)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)出(chu)(chu)的(de)(de)圖(tu)像黑度(du)(du)值調整到與實(shi)(shi)際檢(jian)測(ce)(ce)(ce)(ce)所得膠片相同，并制(zhi)作出(chu)(chu)一系(xi)(xi)(xi)列平板孔型像質計三維圖(tu)將其導入軟(ruan)件(jian)(jian)(jian)(jian)中，用(yong)實(shi)(shi)驗證明出(chu)(chu)該軟(ruan)件(jian)(jian)(jian)(jian)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)圖(tu)像的(de)(de)對比靈(ling)(ling)敏(min)度(du)(du)可(ke)達到2-2T。針對航(hang)空(kong)精(jing)密鑄(zhu)件(jian)(jian)(jian)(jian)結構(gou)復雜(za)，檢(jian)測(ce)(ce)(ce)(ce)困難(nan)的(de)(de)難(nan)題，確定了(le)以計算機(ji)射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)檢(jian)測(ce)(ce)(ce)(ce)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)技(ji)術來(lai)指導實(shi)(shi)際構(gou)件(jian)(jian)(jian)(jian)檢(jian)測(ce)(ce)(ce)(ce)工(gong)(gong)作思路和(he)檢(jian)測(ce)(ce)(ce)(ce)工(gong)(gong)作流程的(de)(de)方法(fa)，并提出(chu)(chu)了(le)采用(yong)雙(shuang)膠片、改變射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)入射(she)(she)(she)(she)角度(du)(du)、改變射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)電壓等方法(fa)消除(chu)不(bu)可(ke)檢(jian)區(qu)(qu)(qu)域，有效的(de)(de)提高了(le)檢(jian)測(ce)(ce)(ce)(ce)靈(ling)(ling)敏(min)度(du)(du)，全面實(shi)(shi)現(xian)了(le)航(hang)空(kong)精(jing)鑄(zhu)支板的(de)(de)計算機(ji)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)設計。研(yan)究結果表(biao)(biao)明：XRSIM射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)檢(jian)測(ce)(ce)(ce)(ce)仿(fang)(fang)(fang)(fang)真(zhen)(zhen)軟(ruan)件(jian)(jian)(jian)(jian)基(ji)于(yu)光(guang)線(xian)(xian)(xian)(xian)(xian)跟蹤技(ji)術與射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)衰減(jian)理(li)論，并以理(li)想探測(ce)(ce)(ce)(ce)器成像，其具(ju)有檢(jian)測(ce)(ce)(ce)(ce)對象(xiang)幾何(he)形(xing)狀輸入簡單方便，給定黑度(du)(du)修正(zheng)(zheng)系(xi)(xi)(xi)數(shu)后的(de)(de)黑度(du)(du)表(biao)(biao)達精(jing)確，密度(du)(du)分辨力和(he)空(kong)間分辨力仿(fang)(fang)(fang)(fang)真(zhen)(zhen)準確，曝光(guang)參數(shu)優化合(he)理(li)，射(she)(she)(she)(she)線(xian)(xian)(xian)(xian)(xian)入射(she)(she)(she)(she)方向上的(de)(de)不(bu)可(ke)檢(jian)區(qu)(qu)(qu)域或(huo)靈(ling)(ling)敏(min)度(du)(du)低區(qu)(qu)(qu)域計算準確等優點。
